Parametric testing of mixed-signal circuits by ANN processing of transient responses.

Andrzej Materka Michal Strzelecki

Published in: J. Electron. Test. (1996)

Keyphrases

mixed signal
vlsi circuits
low power
multi channel
artificial neural networks
real time
data processing
digital circuits
cmos technology
high speed
power consumption
low cost
using artificial neural networks
test cases
steady state
image sensor