Login / Signup

An industrial experience in the built-in self test of embedded RAMs.

Paolo CamuratiPaolo PrinettoMatteo Sonza ReordaStefano BarbagalloAndrea BurriDavide Medina
Published in: VTS (1994)
Keyphrases
  • built in self test
  • industrial applications
  • embedded systems
  • quality improvement
  • similarity measure
  • real time
  • neural network
  • web services
  • image sequences
  • objective function
  • search algorithm
  • integrated circuit