Statistical modeling and analysis of chip-level leakage power by spectral stochastic method.

Ruijing Shen Sheldon X.-D. Tan Ning Mi Yici Cai

Published in: Integr. (2010)

Keyphrases

statistical modeling
preprocessing
high accuracy
similarity measure
image sequences
data analysis
pairwise
significant improvement
dynamic programming
clustering method
high precision
computational complexity
least squares
segmentation method
power consumption
nonparametric bayesian