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Interface Trap Analysis in Multi-Fin FinFET Technology: a Crucial Reliability Issue in Digital Application.
Jyoti Patel
Sankalp Rai
Vivek Kumar
Sudeb Dasgupta
Published in:
ISCAS (2024)
Keyphrases
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key technologies
statistical analysis
reliability analysis
databases
case study
data analysis
information technology
data processing
real time
real world
search engine
social networks
expert systems
image analysis
cost effective
quantitative analysis