On-Chip Test Generation Using Linear Subspaces.

Ramashis Das Igor L. Markov John P. Hayes

Published in: ETS (2006)

Keyphrases

test generation
linear subspace
test cases
image space
low dimensional
subspace learning
face recognition
image set
software testing
quality assurance
static analysis
multi frame
multiple views
subspace clustering
spherical harmonics
viewpoint
high dimensional
single image
software engineering
euclidean distance