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Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress.

Kenta YamadaTakashi SatoShuhei AmakawaNoriaki NakayamaKazuya MasuShigetaka Kumashiro
Published in: IEICE Trans. Electron. (2008)
Keyphrases
  • mathematical model
  • cost function
  • statistical model
  • learning algorithm
  • linear model
  • machine learning
  • genetic algorithm
  • probability distribution
  • em algorithm
  • theoretical analysis
  • formal model