A Performance-Aware MOSFET Threshold Voltage Measurement Circuit in a 65-nm CMOS.
Dong WangXiao Liang TanPak Kwong ChanPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
- low voltage
- cmos technology
- low power
- silicon on insulator
- energy dissipation
- high speed
- metal oxide semiconductor
- power supply
- power consumption
- circuit design
- metal oxide
- power dissipation
- nm technology
- analog vlsi
- low cost
- delay insensitive
- parallel processing
- design considerations
- duty cycle
- vlsi circuits
- high voltage
- image sensor
- neural network
- threshold selection
- power management
- mixed signal
- single phase
- roc curve
- x ray
- infrared