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A 78.8fJ/b/mm 12.0Gb/s/Wire Capacitively Driven On-Chip Link Over 5.6mm with an FFE-Combined Ground-Forcing Biasing Technique for DRAM Global Bus Line in 65nm CMOS.
Sangyoon Lee
Jaekwang Yun
Suhwan Kim
Published in:
ISSCC (2022)
Keyphrases
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high speed
cmos technology
low power
cross section
rms error
low voltage
high density
circuit design
low cost
average error
root mean square
power consumption
analog vlsi
main memory
medical images
real time
nm technology
random access memory