Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid Crystal Displays.
Hong-Dar LinSinga Wang ChiuPublished in: PSIVT (2006)
Keyphrases
- computer aided
- liquid crystal displays
- vision system
- automatic inspection
- thin film transistor
- computer vision
- image formation
- image analysis
- high resolution
- computer aided design
- real time
- visual attention
- surface inspection
- motion blur
- eye tracking
- higher resolution
- thin film
- display devices
- optical flow
- multiresolution
- video sequences
- machine learning