Power noise and its impact on production test and validation of SoC devices.
Karim ArabiPublished in: VTS (2010)
Keyphrases
- embedded systems
- power consumption
- imaging devices
- additive noise
- test data
- noisy data
- random noise
- production planning
- signal to noise ratio
- low power
- noise level
- noise model
- data sets
- embedded devices
- image noise
- model validation
- mobile applications
- statistical significance
- noise reduction
- production system
- missing data
- test cases