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Radiation- and Temperature-Induced Fault Modeling and Simulation in BiCMOS LSI's Components using RAD-THERM TCAD Subsystem.
Konstantin O. Petrosyants
Maxim V. Kozhukhov
Dmitry Popov
Published in:
DDECS (2019)
Keyphrases
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discrete event simulation
building blocks
latent semantic indexing
modeling method
neural network
object oriented
low cost
high speed
x ray
fault diagnosis
vector space
finite element
simulation environment
agent based modeling