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Accelerating capture of infrequent errors on ATE for silicon TV tuners.

Yongquan FanAnant VermaDavid S. TragerRamin K. PoorfardJohn JanneySandeep Kumar
Published in: VTS (2014)
Keyphrases
  • high density
  • data mining
  • error analysis
  • gallium arsenide
  • image processing
  • three dimensional
  • high speed
  • prediction error
  • errors occur