A Sub-1-V 65-nm MOS Threshold Monitoring-Based Voltage Reference.

Xiao Liang Tan Pak Kwong Chan Uday Dasgupta

Published in: IEEE Trans. Very Large Scale Integr. Syst. (2015)

Keyphrases

real time
monitoring system
metal oxide
power system
power supply
decision trees
reference frame
early warning
threshold selection
low voltage
case study
threshold values
condition monitoring
thresholding method
normal operation
high voltage
neural network