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A unified approach for off-line and on-line testing of VLSI systems.
Parag K. Lala
S. Yang
Fadi Busaba
Published in:
DFT (1996)
Keyphrases
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management system
signal processing
complex systems
high speed
distributed systems
neural network
knowledge base
bayesian networks
multiscale
digital libraries
expert systems
low cost
learning systems
test cases
retrieval systems