A unified approach for off-line and on-line testing of VLSI systems.

Parag K. Lala S. Yang Fadi Busaba

Published in: DFT (1996)

Keyphrases

management system
signal processing
complex systems
high speed
distributed systems
neural network
knowledge base
bayesian networks
multiscale
digital libraries
expert systems
low cost
learning systems
test cases
retrieval systems