Diagnostics and Prognostics Method for Analog Electronic Circuits.
Arvind Sai Sarathi VasanBing LongMichael G. PechtPublished in: IEEE Trans. Ind. Electron. (2013)
Keyphrases
- detection method
- significant improvement
- prior knowledge
- high accuracy
- cost function
- support vector machine svm
- learning algorithm
- synthetic data
- optimization algorithm
- edge detection
- computational cost
- experimental evaluation
- feature vectors
- neural network
- medical images
- computationally efficient
- theoretical analysis
- computational complexity
- segmentation method
- mathematical model