Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction.
Kazufumi WatanabeAkinobu TeramotoRihito KurodaShigetoshi SugawaTadahiro OhmiPublished in: Microelectron. Reliab. (2007)
Keyphrases
- energy consumption
- total energy
- prediction accuracy
- positive and negative
- high quality
- prediction model
- air temperature
- energy efficient
- energy efficiency
- computationally efficient
- highly accurate
- prediction error
- solar radiation
- viewpoint
- computational model
- high accuracy
- energy saving
- prediction algorithm
- low energy
- minimum energy
- image segmentation
- life span
- battery powered
- artificial neural networks
- network lifetime
- wireless sensor networks
- energy minimization