Prediction of electronic parameters of compensated multi-crystalline solar-grade silicon using artificial neural networks.
Jagdish C. PatraChiara ModaneseMaurizio AcciarriPublished in: IJCNN (2015)
Keyphrases
- using artificial neural networks
- artificial neural networks
- prediction accuracy
- linear regression model
- root mean square error
- transmission electron microscopy
- low cost
- high speed
- sensitivity analysis
- high density
- genetic algorithm
- liquid crystal
- input parameters
- parameter values
- parameter settings
- expectation maximization
- maximum likelihood
- neural network
- friction coefficient