A Run-Based One-and-a-Half-Scan Connected-Component Labeling Algorithm.
Lifeng HeYuyan ChaoKenji SuzukiPublished in: Int. J. Pattern Recognit. Artif. Intell. (2010)
Keyphrases
- connected component labeling
- binary images
- detection algorithm
- learning algorithm
- dynamic programming
- computational complexity
- expectation maximization
- connected components
- optimal solution
- preprocessing
- raster scan
- single scan
- morphological operations
- segmentation algorithm
- simulated annealing
- k means
- database systems