Retrieving the parameters of cryo Electron Microscopy dataset in the heterogeneous ab-initio case.
Yves MichelsÉtienne BaudrierPublished in: ICIP (2016)
Keyphrases
- electron microscopy
- x ray
- low energy
- image stacks
- thin film
- maximum likelihood
- parameter estimation
- database
- information retrieval
- microscopy images
- benchmark datasets
- parameter settings
- parameter values
- sensitivity analysis
- transmission electron microscopy
- parameter space
- expectation maximization
- low cost
- real world
- neural network