Login / Signup
Correlation verification between transistor variability model with body biasing and ring oscillation frequency in 90nm subthreshold circuits.
Hiroshi Fuketa
Masanori Hashimoto
Yukio Mitsuyama
Takao Onoye
Published in:
ISLPED (2008)
Keyphrases
</>
mathematical model
statistical model
probabilistic model
high level
objective function
data sets
high speed
computational model
theoretical framework
experimental data
formal model
learning algorithm
probability distribution
management system
parameter estimation
finite state machines