3-D compact model for nanoscale junctionless triple-gate nanowire MOSFETs.

Thomas Holtij Michael Graef Alexander Kloes Benjamín Iñíguez

Published in: ESSDERC (2014)

Keyphrases

high speed
data sets
computational model
formal model
machine learning
management system
prior knowledge
parameter estimation
statistical model
data mining
image segmentation
supply chain
theoretical analysis
sensitivity analysis
neural network model
parameter values