Defect Detection of Pantograph Slide Based on Deep Learning and Image Processing Technology.
Xiukun WeiSiyang JiangYan LiChenliang LiLimin JiaYongguang LiPublished in: IEEE Trans. Intell. Transp. Syst. (2020)
Keyphrases
- deep learning
- defect detection
- image processing
- unsupervised feature learning
- feature extraction
- unsupervised learning
- machine learning
- pattern recognition
- machine vision
- computer vision
- image segmentation
- deep architectures
- multiscale
- high resolution
- mental models
- feature selection
- high dimensional
- domain specific
- model selection
- decision trees
- data sets