Multiscale Dense U-Net: A Fast Correction Method for Thermal Drift Artifacts in Laboratory NanoCT Scans of Semi-Conductor Chips.
Mengnan LiuYu HanXiaoqi XiLinlin ZhuShuangzhan YangSiyu TanJian ChenLei LiBin YanPublished in: Entropy (2022)
Keyphrases
- multiscale
- image processing
- image representation
- high quality
- wavelet transform
- high speed
- scale space
- infrared
- virtual laboratory
- natural images
- integrated circuit
- high density
- affine invariant
- concept drift
- image segmentation
- wavelet domain
- coarse to fine
- filter bank
- wavelet coefficients
- power plant
- three dimensional
- multiscale analysis
- partial differential equations
- shape representation
- edge detection
- error accumulation
- multiscale representation