WaferHSL: Wafer Failure Pattern Classification with Efficient Human-Like Staged Learning.

Qijing Wang Martin D. F. Wong

Published in: ICCAD (2022)

Keyphrases

pattern classification
learning process
learning algorithm
feature extraction
multiscale
pattern recognition
unsupervised learning
adaptive learning
image processing
active learning
image features
supervised learning
learning tasks
discriminant embedding