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Soft-error filtering: A solution to the reliability problem of future VLSI digital circuits.
Yvon Savaria
Nicholas C. Rumin
Jeremiah F. Hayes
Vinold K. Agarwal
Published in:
Proc. IEEE (1986)
Keyphrases
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digital circuits
long term
error detection
finite state machines
error rate
signal processing
median filter
functional decomposition
error minimization
vlsi design
filtering algorithm
error analysis
databases
error bounds
closed form
state space
optimal solution