An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic.
Sanjoy MitraDebaprasad DasPublished in: J. Electron. Test. (2020)
Keyphrases
- test data
- ant colony
- ant colony optimization
- metaheuristic
- compression scheme
- image compression
- ant colony optimisation
- simulated annealing
- genetic algorithm
- ant colony algorithm
- swarm intelligence
- tabu search
- optimization problems
- optimisation algorithm
- training data
- data compression
- compression ratio
- traveling salesman problem
- search space
- test cases
- aco algorithm
- test set
- optimization method
- optimal solution
- vehicle routing problem
- particle swarm optimization
- compression algorithm
- data sets
- training set
- hybrid algorithm
- ant miner
- particle swarm optimization pso
- high resolution
- benchmark problems
- high dimensional