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Predicting Time to Failure Using the IMM and Excitable Tests.
E. Phelps
Peter Willett
Thia Kirubarajan
Craig Brideau
Published in:
IEEE Trans. Syst. Man Cybern. Part A (2007)
Keyphrases
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recurrent neural networks
target tracking
neural network
database
information systems
root cause
highly reliable
failure prediction
data sets
information retrieval
genetic algorithm
artificial intelligence
test generation
failure detection