BSIM4 parameter extraction for tri-gate Si nanowire transistors.
Chika TanakaMasumi SaitohKensuke OtaTakayuki IshikawaToshinori NumataPublished in: Microelectron. J. (2016)
Keyphrases
- cmos technology
- power consumption
- information extraction
- leakage current
- field effect transistors
- low power
- parameter values
- input parameters
- parameter tuning
- database
- cloud computing
- maximum likelihood
- high speed
- database systems
- control parameters
- automatically extracted
- website
- circuit design
- automatically extracting
- information systems
- social networks
- nano scale
- artificial intelligence