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Measurement and Compact Modeling of Noise Characteristics in Complementary Junction Field-Effect Transistors.

Alexandr M. PilipenkoFedor A. TsvetkovNikolay N. Prokopenko
Published in: EWDTS (2020)
Keyphrases
  • schottky barrier
  • modeling framework
  • computer vision
  • clustering algorithm
  • real time
  • learning algorithm
  • case study
  • hidden markov models
  • high density
  • mathematical analysis
  • field effect transistors