Monte Carlo modeling of secondary electron emission and its incorporation in particle simulations of electron-surface interaction.
Guoxin ChengLie LiuPublished in: Comput. Phys. Commun. (2011)
Keyphrases
- monte carlo
- electron microscope
- van der waals
- monte carlo method
- simulation study
- monte carlo simulation
- markov chain
- three dimensional
- importance sampling
- monte carlo methods
- adaptive sampling
- x ray
- global illumination
- optimal strategy
- monte carlo tree search
- particle filter
- matrix inversion
- d objects
- game tree search
- stochastic approximation
- variance reduction
- surface reconstruction
- temporal difference
- point processes
- electrical properties
- metal oxide
- least squares
- markovian decision