Estimation of Electromigration-Aggravating Narrow Interconnects Using a Layout Sensitivity Model.
Rani S. GhaidaPayman Zarkesh-HaPublished in: DFT (2007)
Keyphrases
- sensitivity analysis
- probabilistic model
- computational model
- management system
- monte carlo simulation
- parameter estimation
- high speed
- theoretical framework
- prediction model
- conceptual model
- mathematical model
- parametric models
- estimation algorithm
- formal model
- input output
- statistical model
- neural network
- input data
- data model
- multiscale