An orthogonal wavelet denoising algorithm for surface images of atomic force microscopy.
Manuel SchimmackPaolo MercorelliAnthimos GeorgiadisPublished in: MMAR (2016)
Keyphrases
- denoising algorithm
- denoising
- denoising methods
- input image
- image data
- image denoising
- edge detection
- gaussian noise
- test images
- wavelet coefficients
- wavelet transform
- wavelet denoising
- atomic force microscopy
- peak signal to noise ratio
- natural images
- image registration
- multiresolution
- noisy images
- noise reduction
- computer vision
- wavelet features
- cone beam computed tomography
- noise model
- transform domain
- noise level
- wavelet domain
- segmentation method
- error rate
- higher order
- object recognition
- multiscale
- image processing