Login / Signup

Test of a switched-capacitor ADC by a built-in charge sensor.

Román MozuelosYolanda LechugaMar MartínezSalvador Bracho
Published in: Microelectron. J. (2005)
Keyphrases
  • sensor data
  • real time
  • sensor networks
  • test data
  • statistical tests
  • sensor fusion
  • data sets
  • neural network
  • bayesian networks
  • expert systems
  • statistical significance
  • charge coupled devices