Noise-rejection model based on charge-transfer equation for digital CMOS circuits.
Alexander KorshakPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2004)
Keyphrases
- circuit design
- charge coupled device
- high speed
- mixed signal
- analog vlsi
- wide dynamic range
- delay insensitive
- low power
- vlsi circuits
- dynamic range
- charge coupled devices
- ccd camera
- multi channel
- photon counting
- random noise
- power consumption
- focal plane
- signal to noise ratio
- noise level
- digital camera
- differential equations
- low voltage
- transfer learning
- digital circuits
- missing data
- mathematical model
- image sensor
- cmos technology
- noisy data
- scale space
- real time
- random access memory
- power dissipation
- noise reduction
- numerical solution
- noise model
- gaussian noise
- digital content