SPECULAR AND DIFFUSE REFLECTION
Experts
- Heung-Yeung Shum
- Stephen Lin
- Zhong Zhang
- Abhijeet Ghosh
- Takayuki Okatani
- Feng Lu
- Takashi Imamura
- Tetsuo Miyake
- Sijia Wen
- Paul E. Debevec
- Stan Z. Li
- Jianwei Yang
- Lawrence B. Wolff
- Akinori F. Ebihara
- Michael Zollhöfer
- Jason Dourgarian
- Matt Whalen
- Shiqing Ren
- Yinqiang Zheng
- Lixing Liu
- Dar'ya Guarnera
- David A. Clausi
- Alberto Tonizzo
- Xiaohua Zhang
- Peter Denny
- Boren Li
- Yingqiang Zheng
- Jon Yngve Hardeberg
- Rushane Dyer
- Peter Lincoln
- Tobias Ritschel
- Kiichi Kobayashi
- Haibin Wu
- Tomonari Furukawa
- Julien P. C. Valentin
- Adarsh Kowdle
- Hyeongwoo Kim
- Soma Biswas
- Mario Fritz
Venues
- CoRR
- CVPR
- IEEE Trans. Image Process.
- Color Imaging Conference
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
- MVA
- Int. J. Comput. Vis.
- IGARSS (4)
- SIGGRAPH Posters
- NCVPRIPG
- ACCV (5)
- ACM Trans. Appl. Percept.
- CVPR (1)
- ICICIC (1)
- CAIP
- ICIP
- Comput. Vis. Image Underst.
- IW-FCV
- ICCV Workshops
- Sensors
- BMVC
- Inf. Media Technol.
- ECCV (3)
- EGSR (EI&I)
- J. Imaging
- ICIAR
- ACCV (4)
- IAS
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend