REFLECTANCE MAP
Experts
- Edwin R. Hancock
- Roberto Mecca
- Yasuyuki Matsushita
- Yvain Quéau
- Roberto Cipolla
- Philip L. Worthington
- Jean-Denis Durou
- Michael Breuß
- Alfred M. Bruckstein
- Boxin Shi
- Daniel Cremers
- Fotios Logothetis
- Osamu Ikeda
- Ryszard Kozera
- David J. Kriegman
- José R. A. Torreão
- Junyu Dong
- Melvyn L. Smith
- Minoru Asada
- Yong Chul Ju
- Satoshi Ikehata
- Andrew Zisserman
- Pieter Peers
- Vasileios Argyriou
- Andrés Bruhn
- Ronen Basri
- David A. Forsyth
- William A. P. Smith
- Lyndon N. Smith
- Jiuai Sun
- Daniel Maurer
- James C. Bieron
- Takashi Matsuyama
- Toshikazu Wada
- Ron Kimmel
- Katsushi Ikeuchi
- Ping-Sing Tsai
- Kai Han
- Maria Petrou
Venues
- CVPR
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- Int. J. Comput. Vis.
- Pattern Recognit. Lett.
- ICIP
- BMVC
- Image Vis. Comput.
- ICPR (1)
- Pattern Recognit.
- SSVM
- J. Math. Imaging Vis.
- MVA
- Comput. Vis. Image Underst.
- ACM Trans. Graph.
- Comput. Graph.
- ICIP (2)
- ICPR
- CAIP
- IJCAI
- 3DV
- ECCV (2)
- Systems and Computers in Japan
- CVPR (1)
- AAAI
- ACCV (4)
- IEEE Access
- IEEE Computer Graphics and Applications
- Mach. Vis. Appl.
- DAGM-Symposium
- VISAPP (2)
- CVGIP Image Underst.
- ICCVG
- Int. J. Pattern Recognit. Artif. Intell.
- Int. J. Imaging Syst. Technol.
- EMMCVPR
- ICCP
- Human Vision and Electronic Imaging
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