REFLECTANCE MAP
Experts
- Edwin R. Hancock
- Roberto Mecca
- Yvain Quéau
- Yasuyuki Matsushita
- Roberto Cipolla
- Philip L. Worthington
- Jean-Denis Durou
- Alfred M. Bruckstein
- Michael Breuß
- Boxin Shi
- Ryszard Kozera
- Osamu Ikeda
- Daniel Cremers
- David J. Kriegman
- Fotios Logothetis
- David A. Forsyth
- Melvyn L. Smith
- Minoru Asada
- Vasileios Argyriou
- Pieter Peers
- José R. A. Torreão
- Satoshi Ikehata
- Andrés Bruhn
- Ronen Basri
- Yong Chul Ju
- William A. P. Smith
- Andrew Zisserman
- Junyu Dong
- Maria Petrou
- Yee-Hong Yang
- Lyndon N. Smith
- Ping Tan
- Luc Van Gool
- James C. Bieron
- Rui Huang
- Masaaki Iiyama
- Kwan-Yee K. Wong
- Yu-Wing Tai
- Mike J. Chantler
Venues
- CVPR
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- Int. J. Comput. Vis.
- ICIP
- Pattern Recognit. Lett.
- BMVC
- Image Vis. Comput.
- ICPR (1)
- Pattern Recognit.
- Comput. Vis. Image Underst.
- MVA
- ACM Trans. Graph.
- J. Math. Imaging Vis.
- SSVM
- ICPR
- ICIP (2)
- CAIP
- Comput. Graph.
- Systems and Computers in Japan
- Mach. Vis. Appl.
- ACCV (4)
- DAGM-Symposium
- ECCV (2)
- IJCAI
- AAAI
- CVPR (1)
- IEEE Computer Graphics and Applications
- VISAPP (2)
- 3DV
- IEEE Access
- ECCV (3)
- EMMCVPR
- CVGIP Image Underst.
- ICNC (5)
- Comput. Aided Des.
- Signal Process.
- Graph. Model.
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