REFLECTANCE MAP
Experts
- Edwin R. Hancock
- Roberto Mecca
- Yvain Quéau
- Yasuyuki Matsushita
- Roberto Cipolla
- Alfred M. Bruckstein
- Michael Breuß
- Jean-Denis Durou
- Philip L. Worthington
- Boxin Shi
- David J. Kriegman
- Ryszard Kozera
- Fotios Logothetis
- Osamu Ikeda
- Daniel Cremers
- Andrés Bruhn
- Minoru Asada
- Vasileios Argyriou
- Junyu Dong
- Yong Chul Ju
- William A. P. Smith
- José R. A. Torreão
- Andrew Zisserman
- Pieter Peers
- Ronen Basri
- David A. Forsyth
- Satoshi Ikehata
- Melvyn L. Smith
- Ron Kimmel
- Kai Han
- Takayuki Nakamura
- Yoshiaki Shirai
- Toshikazu Wada
- Mubarak Shah
- Rui J. P. de Figueiredo
- Masaaki Iiyama
- Michihiko Minoh
- Atsushi Hashimoto
- Yuki Fujimura
Venues
- CVPR
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- Int. J. Comput. Vis.
- ICIP
- Pattern Recognit. Lett.
- BMVC
- ICPR (1)
- Image Vis. Comput.
- Pattern Recognit.
- SSVM
- ACM Trans. Graph.
- MVA
- J. Math. Imaging Vis.
- Comput. Vis. Image Underst.
- Comput. Graph.
- ICIP (2)
- ICPR
- CAIP
- 3DV
- AAAI
- VISAPP (2)
- DAGM-Symposium
- Systems and Computers in Japan
- IEEE Computer Graphics and Applications
- IJCAI
- CVPR (1)
- ACCV (4)
- IEEE Access
- ECCV (2)
- Mach. Vis. Appl.
- APL
- CRV
- EMMCVPR
- WACV
- ICCVG
- ECCV Workshops (1)
- Sensors
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