REFLECTANCE MAP
Experts
- Edwin R. Hancock
- Roberto Mecca
- Yasuyuki Matsushita
- Yvain Quéau
- Roberto Cipolla
- Alfred M. Bruckstein
- Jean-Denis Durou
- Michael Breuß
- Philip L. Worthington
- Boxin Shi
- David J. Kriegman
- Fotios Logothetis
- Ryszard Kozera
- Daniel Cremers
- Osamu Ikeda
- Ronen Basri
- José R. A. Torreão
- Junyu Dong
- Andrés Bruhn
- Andrew Zisserman
- Pieter Peers
- Yong Chul Ju
- Satoshi Ikehata
- Minoru Asada
- Melvyn L. Smith
- David A. Forsyth
- Vasileios Argyriou
- William A. P. Smith
- Takashi Matsuyama
- Ron Kimmel
- Yuki Fujimura
- Mubarak Shah
- Masaaki Iiyama
- Yuji Iwahori
- Christian Wöhler
- Mike J. Chantler
- Kai Han
- Kwan-Yee K. Wong
- Guanying Chen
Venues
- CVPR
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- Int. J. Comput. Vis.
- Pattern Recognit. Lett.
- ICIP
- BMVC
- Pattern Recognit.
- ICPR (1)
- Image Vis. Comput.
- J. Math. Imaging Vis.
- Comput. Vis. Image Underst.
- SSVM
- MVA
- ACM Trans. Graph.
- ICIP (2)
- ICPR
- Comput. Graph.
- CAIP
- ECCV (2)
- AAAI
- 3DV
- IEEE Access
- DAGM-Symposium
- Systems and Computers in Japan
- CVPR (1)
- IEEE Computer Graphics and Applications
- Mach. Vis. Appl.
- IJCAI
- VISAPP (2)
- ACCV (4)
- NIPS
- APL
- Int. J. Pattern Recognit. Artif. Intell.
- ECCV (3)
- ECCV
- EMMCVPR
- ECCV (4)
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