REFLECTANCE FUNCTION
Experts
- Paul E. Debevec
- Lynn Fyffe
- Hideo Saito
- Jan Meseth
- Shawn Hempel
- Pieter Peers
- Graham Fyffe
- Craig Miller
- Andrea Weidlich
- Shinji Ozawa
- Kazuko Omata
- Imari Sato
- Yoichi Sato
- Paul Carroll
- Zhenxiong Jian
- Radim Sára
- Jiping Lu
- Edwin R. Hancock
- Takahiro Okabe
- Haruo Takemura
- Narendra Ahuja
- Bill Ambrisco
- Antonio M. López
- Xiaowu Chen
- Hiroyuki Kamei
- Rui Xia
- Shoichiro Yamaguchi
- Felipe Lumbreras
- James J. Little
- Ming Jun Ren
- Tejas Madan Tanksale
- Carme Julià
- Ondrej Drbohlav
- Tomohiro Mashita
- Angel Domingo Sappa
- Takafumi Iwaguchi
- Xin Tong
- Ning Xu
- Yue Dong
Venues
- ICCV
- Rendering Techniques
- Int. J. Comput. Vis.
- ICIAR
- 3DIM
- IEEE Trans. Pattern Anal. Mach. Intell.
- WACV
- CVPR
- J. Comput. Civ. Eng.
- IEEE Trans. Instrum. Meas.
- CVPR (2)
- Measuring, Modeling, and Reproducing Material Appearance
- Image Vis. Comput.
- Systems and Computers in Japan
- Comput. Vis. Image Underst.
- IEEE Trans. Image Process.
- 3DPVT
- VR
- SIGGRAPH Posters
- ECCV Workshops (2)
- SIGGRAPH Talks
- ACM Trans. Graph.
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