REFERENCE POINT
Experts
- Anil K. Jain
- Hisao Ishibuchi
- Jianjiang Feng
- Wlodzimierz Ogryczak
- Kai Cao
- Yusuke Nojima
- Jie Tian
- En Zhu
- Venu Govindaraju
- Bir Bhanu
- Christoph Busch
- Jin Qi
- Jie Zhou
- Mengjie Zhang
- Jianping Yin
- Tobias Friedrich
- Xin Yang
- Xuejun Tan
- Francisco Ruiz
- Xudong Jiang
- Sharath Pankanti
- Krzysztof Wrobel
- Yeganeh Bahoo
- Frank Neumann
- Nalini K. Ratha
- Arun Ross
- Wei-Yun Yau
- Eryun Liu
- Karthik Nandakumar
- Stephane Durocher
- Ruud M. Bolle
- Jose Manuel Cabello
- Jianjun Zhu
- Bala Srinivasan
- Haim Kaplan
- Yi Mei
- Gang Chen
- Jaihie Kim
- Khaled Ghédira
Venues
- CoRR
- Pattern Recognit.
- Eur. J. Oper. Res.
- ICIP
- IEEE Access
- ICB
- IEEE Trans. Inf. Forensics Secur.
- Manag. Sci.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CEC
- Inf. Sci.
- Appl. Soft Comput.
- IEEE Trans. Evol. Comput.
- Pattern Recognit. Lett.
- ICPR
- BIOSIG
- ICASSP
- Sensors
- J. Oper. Res. Soc.
- Neurocomputing
- Multim. Tools Appl.
- CCCG
- J. Intell. Fuzzy Syst.
- ICBA
- GECCO
- Swarm Evol. Comput.
- SMC
- AVBPA
- Oper. Res.
- IJCB
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Trans. Image Process.
- Inf. Process. Lett.
- Remote. Sens.
- IGARSS
- J. Electronic Imaging
- Comput. Oper. Res.
- Expert Syst. Appl.
- Discret. Comput. Geom.
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