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Experts
- Farzin Mokhtarian
- Rida T. Farouki
- Bert Jüttler
- Gershon Elber
- Juan Gerardo Alcázar
- Baojiang Zhong
- Myung-Soo Kim
- Bart M. ter Haar Romeny
- Falai Chen
- Luc Florack
- Xiaohong Jia
- Thomas W. Sederberg
- Josef Schicho
- J. Rafael Sendra
- Reza Rezaeian Farashahi
- Jörg Peters
- Ahmad H. Nasri
- Carlos Hermoso
- Mehdi Tibouchi
- Atsushi Imiya
- Sonia Pérez-Díaz
- Max A. Viergever
- Zbynek Sír
- Takis Sakkalis
- Jeff Erickson
- Miroslav Lávicka
- Ron Goldman
- Tanja Lange
- Tomoya Sakai
- Xunnian Yang
- Tim N. T. Goodman
- Maria Montanucci
- Georg Muntingh
- Tamal K. Dey
- Hongfeng Wu
- Kai-Kuang Ma
- Hüseyin Hisil
- Azriel Rosenfeld
- Young Joon Ahn
Venues
- CoRR
- Comput. Aided Geom. Des.
- Comput. Aided Des.
- IACR Cryptol. ePrint Arch.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- J. Symb. Comput.
- Discret. Math.
- Finite Fields Their Appl.
- Des. Codes Cryptogr.
- J. Comput. Appl. Math.
- CVPR
- J. Math. Imaging Vis.
- Comput. Graph.
- Scale-Space
- Appl. Math. Comput.
- Eur. J. Comb.
- Pattern Recognit. Lett.
- Vis. Comput.
- Math. Comput.
- J. Comb. Theory, Ser. A
- SCG
- Am. Math. Mon.
- Discret. Comput. Geom.
- Symmetry
- ICCV
- ACM Trans. Graph.
- Sensors
- ICRA
- ICPR
- IEEE Trans. Vis. Comput. Graph.
- Int. J. Comput. Vis.
- ICIP
- SSVM
- Electron. J. Comb.
- Comput. Graph. Forum
- Image Vis. Comput.
- IEEE Trans. Image Process.
- ICASSP
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