PHOTOMETRIC INVARIANT
Experts
- Theo Gevers
- Joost van de Weijer
- Arnold W. M. Smeulders
- Lei Guo
- Peter N. Belhumeur
- James R. Glass
- Nojun Kwak
- Todd E. Zickler
- Sungho Kim
- Wei-Yang Lin
- Wei-Ning Hsu
- Harro M. G. Stokman
- Nigel Boston
- Zhe Lin
- Satya P. Mallick
- Qianjin Zhang
- KiYoon Yoo
- Partha Das
- Jiho Jang
- Chengwen Yu
- David J. Kriegman
- Wonhyuk Ahn
- Kenji Nagao
- In-So Kweon
- Sezer Karaoglu
- Christian Merdon
- Nathalie Laurent
- Bingwei Zheng
- Kenneth Nilsson
- Liang Lin
- Jinghui Qin
- Lei Li
- Yu Hu
- Xuesong Wang
- Yukitoshi Watanabe
- Jun Sato
- Jinwoo Choi
- Evgeniy Bart
- Weiguo Cao
Venues
- CoRR
- ICCV
- ICIP
- DAGM-Symposium
- IROS
- IEEE Trans. Pattern Anal. Mach. Intell.
- Int. J. Comput. Vis.
- USENIX Security Symposium
- ICNC-FSKD
- Remote. Sens.
- ICPR
- IEEE Trans. Image Process.
- ICCE
- IGARSS
- EURASIP J. Image Video Process.
- Eur. J. Comb.
- ICNC (2)
- IEEE Trans. Geosci. Remote. Sens.
- AISafety@IJCAI
- Shape Modeling International
- Pattern Recognit. Lett.
- ACL (1)
- Color Imaging Conference
- MMSP
- ICRA
- IGARSS (1)
- Eur. J. Oper. Res.
- AAAI
- BMVC
- ACM Commun. Comput. Algebra
- IEEE Trans. Commun.
- ICTAI (1)
- Neural Comput. Appl.
- J. Electronic Imaging
- Bull. EATCS
- J. Symb. Log.
- J. Vis. Commun. Image Represent.
- CGIV
- MCAM
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