MULTI PIE
Experts
- Simon Baker
- Myung-Cheol Roh
- Iacopo Masi
- Gérard G. Medioni
- Prem Natarajan
- Zhen Lei
- Seong-Whan Lee
- Gerhard Rigoll
- Jongmoo Choi
- Tadas Baltrusaitis
- Jungyeon Kim
- Ying Tai
- Weihong Deng
- Dong Chen
- Terence Sim
- Jianjun Qian
- Iain A. Matthews
- Mohammad Saeed Ebrahimi Saadabadi
- Sang-Il Choi
- Jeffrey F. Cohn
- Aijing Yu
- Takeo Kanade
- Arjan Kuijper
- Yigong Zhang
- Florian Kirchbuchner
- Nasser M. Nasrabadi
- Bon-Woo Hwang
- Haoxue Wu
- Tal Hassner
- Stan Z. Li
- Hyeran Byun
- Jingjing Shen
- Maan Bsat
- Wen Gao
- Jirí Mekyska
- Lifang Wu
- Jiani Hu
- Gwangbin Bae
- Charlie Hewitt
Venues
- CoRR
- FG
- CVPR
- Multim. Tools Appl.
- ICPR
- BIOSIG
- IJCB
- Pattern Recognit. Lett.
- CVPR Workshops
- FGR
- J. Electronic Imaging
- AVBPA
- IEEE Trans. Image Process.
- IEEE Trans. Inf. Forensics Secur.
- Systems and Computers in Japan
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Frankl. Inst.
- IDA
- Int. J. Mach. Learn. Cybern.
- CW
- ICVS
- BIOSIGNALS
- SDM
- ICCSA (4)
- Sensors
- IEA/AIE
- CORES
- IP&C
- ISVC (2)
- CCBR
- Human Vision and Electronic Imaging
- 计算机科学
- ICMV
- ICIP
- SNPD
- ICCMS
- F1000Research
- AMFG
- ICCTA
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