MULTI PIE
Experts
- Simon Baker
- Iacopo Masi
- Myung-Cheol Roh
- Zhen Lei
- Gérard G. Medioni
- Seong-Whan Lee
- Prem Natarajan
- Gerhard Rigoll
- Jirí Mekyska
- Aijing Yu
- Mohammad Saeed Ebrahimi Saadabadi
- Jungyeon Kim
- Chong-Ho Choi
- Jeffrey F. Cohn
- Sang-Il Choi
- Florian Kirchbuchner
- Arjan Kuijper
- Terence Sim
- Sahar Rahimi Malakshan
- Philipp Terhörst
- Jianjun Qian
- Yigong Zhang
- Jan Niklas Kolf
- Stefan Hörmann
- Hyeran Byun
- Charlie Hewitt
- Wen Gao
- Jian Yang
- Gwangbin Bae
- Martin de La Gorce
- Ran He
- Ralph Gross
- Weihong Deng
- Marcos Faúndez-Zanuy
- Dong Chen
- Lei Luo
- Naser Damer
- Daniel Fährmann
- Roberto Cipolla
Venues
- CoRR
- FG
- CVPR
- BIOSIG
- ICPR
- Multim. Tools Appl.
- Pattern Recognit. Lett.
- J. Electronic Imaging
- IEEE Trans. Image Process.
- CVPR Workshops
- FGR
- IEEE Trans. Inf. Forensics Secur.
- IJCB
- AVBPA
- HCI (19)
- Inf. Sci.
- Complex Adaptive Systems
- J. Frankl. Inst.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IDA
- ICT-EurAsia/CONFENIS
- Int. J. Comput. Vis.
- IEA/AIE
- ICMV
- Image Vis. Comput.
- MMSP
- ICCTA
- IEEE Trans. Syst. Man Cybern. Part B
- ICVS
- ICAILP
- Int. J. Mach. Learn. Cybern.
- WACV
- AMFG
- NCVPRIPG
- Cogn. Comput.
- F1000Research
- IEEE Access
- SSPR/SPR
- Sensors
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend