MULTI PIE
Experts
- Simon Baker
- Zhen Lei
- Prem Natarajan
- Gérard G. Medioni
- Seong-Whan Lee
- Iacopo Masi
- Myung-Cheol Roh
- Gerhard Rigoll
- Jan Niklas Kolf
- Florian Kirchbuchner
- Roberto Cipolla
- Jianjun Qian
- Stan Z. Li
- Jiani Hu
- Stefan Hörmann
- Mohammad Saeed Ebrahimi Saadabadi
- Virginia Espinosa-Duro
- Hyeran Byun
- Jingjing Shen
- Yong Man Ro
- Iain A. Matthews
- Nasser M. Nasrabadi
- Martin de La Gorce
- Tal Hassner
- Lifang Wu
- Jirí Mekyska
- Jongmoo Choi
- Martin Knoche
- Jeffrey F. Cohn
- Yigong Zhang
- Wen Gao
- Jian Yang
- Marcos Faúndez-Zanuy
- Dong Chen
- Huaibo Huang
- Ran He
- Terence Sim
- Takeo Kanade
- Moktari Mostofa
Venues
- CoRR
- FG
- CVPR
- ICPR
- BIOSIG
- Multim. Tools Appl.
- IJCB
- J. Electronic Imaging
- IEEE Trans. Inf. Forensics Secur.
- CVPR Workshops
- IEEE Trans. Image Process.
- AVBPA
- FGR
- Pattern Recognit. Lett.
- HCI (19)
- ICCSA (4)
- J. Frankl. Inst.
- ICAILP
- Complex Adaptive Systems
- IEEE Access
- ICIP (1)
- ICCTA
- Cogn. Comput.
- ICVS
- Int. J. Comput. Vis.
- Int. J. Wavelets Multiresolution Inf. Process.
- IP&C
- Systems and Computers in Japan
- SDM
- NCVPRIPG
- ESANN
- Image Vis. Comput.
- AMFG
- MMSP
- SNPD
- ICVGIP Workshops
- Inf. Sci.
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
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