MINIMUM DESCRIPTION LENGTH CRITERION
Experts
- Yasuyuki Matsushita
- Lyndon N. Smith
- Ping Tan
- Melvyn L. Smith
- In So Kweon
- Jiyoung Jung
- Satoshi Ikehata
- Boxin Shi
- Joon-Young Lee
- Roberto Mecca
- Gule Saman
- Zitong Yu
- Long Quan
- Roberto Cipolla
- Soumyadip Sengupta
- Felicja Okulicka-Dluzewska
- Daniel Lichy
- Jean-Denis Durou
- Paulo F. U. Gotardo
- Stephen Lin
- Nicu Sebe
- Edwin R. Hancock
- Chi-Keung Tang
- Tai-Pang Wu
- Abdul R. Farooq
- Qian Zheng
- Hao Tang
- Guoying Zhao
- Delphine Le Guen
- James J. Clark
- Xudong Jiang
- Jinsong Zhang
- Alex C. Kot
- Jens Ackermann
- Yannick Hold-Geoffroy
- Michael Goesele
- Alexander Berenstein
- Yvain Quéau
- David W. Jacobs
Venues
- CoRR
- CVPR
- Commun. Stat. Simul. Comput.
- ICCV
- Int. J. Comput. Vis.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Sensors
- Entropy
- BMVC
- ICCP
- CCCG
- Discret. Math.
- Pattern Recognit. Lett.
- ICIP
- MVA
- J. Multivar. Anal.
- ICASSP
- Symmetry
- Technometrics
- ICPR
- Image Vis. Comput.
- 3DV
- Arch. Math. Log.
- J. Intell. Fuzzy Syst.
- IEEE Trans. Circuits Syst. Video Technol.
- ISCAS (3)
- Pattern Recognit.
- Comput. Stat.
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- Int. J. Syst. Assur. Eng. Manag.
- Comput. Ind.
- Pattern Anal. Appl.
- EUROCRYPT
- Neural Comput.
- Comput. Stat. Data Anal.
- SIGGRAPH Sketches
- ICRA
- CAIP (2)
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend