MINIMUM DESCRIPTION LENGTH CRITERION
Experts
- Melvyn L. Smith
- Ping Tan
- Lyndon N. Smith
- Yasuyuki Matsushita
- In So Kweon
- Satoshi Ikehata
- Jiyoung Jung
- Gule Saman
- Roberto Mecca
- Joon-Young Lee
- Boxin Shi
- Xudong Jiang
- Alex C. Kot
- Jinsong Zhang
- James J. Clark
- Delphine Le Guen
- Hao Tang
- Guoying Zhao
- Abdul R. Farooq
- Qian Zheng
- Tai-Pang Wu
- Chi-Keung Tang
- Nicu Sebe
- Edwin R. Hancock
- Daniel Lichy
- Paulo F. U. Gotardo
- Stephen Lin
- Jean-Denis Durou
- Felicja Okulicka-Dluzewska
- Soumyadip Sengupta
- Long Quan
- Roberto Cipolla
- Zitong Yu
- Jean-François Lalonde
- Ryszard Kozera
- Henri Nicolas
- Lyle Noakes
- Suchandan Kayal
- Jiuai Sun
Venues
- CoRR
- CVPR
- Commun. Stat. Simul. Comput.
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- Int. J. Comput. Vis.
- Sensors
- Entropy
- BMVC
- Discret. Math.
- Pattern Recognit. Lett.
- ICIP
- CCCG
- ICCP
- MVA
- J. Multivar. Anal.
- ICASSP
- Symmetry
- Image Vis. Comput.
- Technometrics
- ICPR
- 3DV
- Arch. Math. Log.
- J. Intell. Fuzzy Syst.
- Comput. Ind.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- Comput. Stat. Data Anal.
- CAIP (2)
- ECCV (5)
- IEEE Trans. Circuits Syst. Video Technol.
- ISCAS (3)
- Pattern Recognit.
- Int. J. Syst. Assur. Eng. Manag.
- ECCV (4)
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Computer Graphics and Applications
- SIGGRAPH Sketches
- ICRA
- Pattern Anal. Appl.
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