MINIMUM DESCRIPTION LENGTH CRITERION
Experts
- Melvyn L. Smith
- Ping Tan
- Lyndon N. Smith
- Yasuyuki Matsushita
- In So Kweon
- Joon-Young Lee
- Satoshi Ikehata
- Boxin Shi
- Jiyoung Jung
- Roberto Mecca
- Gule Saman
- Evgueni Vassiliev
- Michael Goesele
- Yannick Hold-Geoffroy
- Jinsong Zhang
- Jean-François Lalonde
- Soumyadip Sengupta
- Long Quan
- David Eppstein
- Guoying Zhao
- Jean-Denis Durou
- Tai-Pang Wu
- Stéphane Pateux
- Yiming Jia
- Yvain Quéau
- Haoyu Chen
- Stephen Lin
- Alexander Berenstein
- Ryszard Kozera
- Felicja Okulicka-Dluzewska
- Henri Nicolas
- Alex C. Kot
- Suchandan Kayal
- Lyle Noakes
- Xudong Jiang
- Delphine Le Guen
- Heng Guo
- Edwin R. Hancock
- Jens Ackermann
Venues
- CoRR
- CVPR
- Commun. Stat. Simul. Comput.
- ICCV
- Sensors
- Int. J. Comput. Vis.
- BMVC
- IEEE Trans. Pattern Anal. Mach. Intell.
- Entropy
- J. Intell. Fuzzy Syst.
- ICASSP
- ICPR
- 3DV
- Technometrics
- ICIP
- MVA
- Arch. Math. Log.
- J. Multivar. Anal.
- Image Vis. Comput.
- CCCG
- ICCP
- Pattern Recognit. Lett.
- Discret. Math.
- Comput. Stat. Data Anal.
- J. Comb. Theory, Ser. A
- Remote. Sens.
- IJCAI
- DSP
- Found. Trends Comput. Graph. Vis.
- Mach. Vis. Appl.
- Pattern Anal. Appl.
- Pattern Recognit.
- IEEE Trans. Image Process.
- Neural Comput.
- Comput. Aided Des.
- IGARSS
- Axioms
- SCG
- ICCVG
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