MINIMUM DESCRIPTION LENGTH CRITERION
Experts
- Yasuyuki Matsushita
- Ping Tan
- Melvyn L. Smith
- Lyndon N. Smith
- In So Kweon
- Roberto Mecca
- Satoshi Ikehata
- Boxin Shi
- Jiyoung Jung
- Gule Saman
- Joon-Young Lee
- David Eppstein
- Qian Zheng
- Sudipta N. Sinha
- Guoying Zhao
- Michael Goesele
- Haoyu Chen
- Alexander Berenstein
- Felicja Okulicka-Dluzewska
- Abdul R. Farooq
- Yvain Quéau
- Jinsong Zhang
- Yannick Hold-Geoffroy
- David W. Jacobs
- Evgueni Vassiliev
- Alex C. Kot
- Soumyadip Sengupta
- Henri Nicolas
- Heng Guo
- Hao Tang
- Stephen Lin
- Roberto Cipolla
- Nicu Sebe
- Jean-François Lalonde
- Daniel Lichy
- Chi-Keung Tang
- Jens Ackermann
- Kousik Maiti
- Zitong Yu
Venues
- CoRR
- CVPR
- Commun. Stat. Simul. Comput.
- ICCV
- BMVC
- Entropy
- IEEE Trans. Pattern Anal. Mach. Intell.
- Sensors
- Int. J. Comput. Vis.
- Technometrics
- Pattern Recognit. Lett.
- Arch. Math. Log.
- Symmetry
- ICASSP
- Image Vis. Comput.
- ICIP
- J. Intell. Fuzzy Syst.
- ICPR
- MVA
- J. Multivar. Anal.
- Discret. Math.
- 3DV
- CCCG
- ICCP
- ICCVG
- J. Comb. Theory, Ser. A
- IJCAI
- Qual. Reliab. Eng. Int.
- Des. Codes Cryptogr.
- HAPTICS
- SIAM J. Imaging Sci.
- Comput. Commun.
- ICIP (1)
- ISCAS (3)
- Eurobot Conference
- Comput. Stat.
- Pattern Anal. Appl.
- ECCV (3)
- Complex.
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