MATCHED POINTS
Experts
- Pablo Pérez-Lantero
- Carlos Seara
- Gil Ben-Artzi
- Clemens Huemer
- Adrian Dumitrescu
- Carlos Ochoa
- Ahmad Biniaz
- Jihwan Woo
- Eduard Trulls
- Robert T. Collins
- Micha Sharir
- Allen R. Hanson
- Taemin Kim
- Wojciech Chojnacki
- Luis Evaristo Caraballo
- Jorge Urrutia
- Michael J. Brooks
- Daming Shi
- Ferran Hurtado
- Kwang Moo Yi
- Xifeng Tong
- Jan Hosang
- Olivier D. Faugeras
- Rodrigo I. Silveira
- Anil Maheshwari
- Michiel H. M. Smid
- Mikio Kano
- Erik D. Demaine
- Yong-Qing Cheng
- Xiaoguang Wang
- Xianglong Tang
- Andrea Tagliasacchi
- Edward M. Riseman
- Anton van den Hengel
- Wei Jiang
- In-So Kweon
- Harit P. Trivedi
- Arjan Kuijper
- Rokas Masiulis
Venues
- CoRR
- ICIP
- CCCG
- Pattern Recognit.
- ICCV
- J. Math. Imaging Vis.
- ICRA
- BMVC
- Int. J. Comput. Vis.
- Discret. Math.
- CVPR
- Pattern Recognit. Lett.
- ICPR
- Comput. Geom.
- Remote. Sens.
- IEEE Access
- Discret. Comput. Geom.
- Sensors
- DAGM-Symposium
- Image Vis. Comput.
- J. Comb. Theory, Ser. A
- ITITS (2)
- EITCE
- ICCDA
- Shape Modeling International
- MVA
- IEEE Trans. Circuits Syst. Video Technol.
- SIBGRAPI
- CAEPIA
- Inf. Process. Lett.
- J. Comb. Optim.
- ECCV (28)
- ISVC (1)
- IbPRIA
- TAROS
- Multim. Tools Appl.
- ECCV (3)
- IJCB
- Asia Pac. J. Oper. Res.
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