MATCHED POINTS
Experts
- Pablo Pérez-Lantero
- Carlos Seara
- Gil Ben-Artzi
- Clemens Huemer
- Anil Maheshwari
- Carlos Ochoa
- Daming Shi
- Jorge Urrutia
- Olivier D. Faugeras
- Jihwan Woo
- Jan Hosang
- Ferran Hurtado
- Xifeng Tong
- Allen R. Hanson
- Michiel H. M. Smid
- Andrea Tagliasacchi
- Ahmad Biniaz
- Xiaoguang Wang
- Anton van den Hengel
- Mikio Kano
- Edward M. Riseman
- Michael J. Brooks
- Adrian Dumitrescu
- Wei Jiang
- Erik D. Demaine
- Luis Evaristo Caraballo
- Eduard Trulls
- Harit P. Trivedi
- Taemin Kim
- Wojciech Chojnacki
- Xianglong Tang
- Robert T. Collins
- Rodrigo I. Silveira
- Kwang Moo Yi
- Micha Sharir
- Yong-Qing Cheng
- In-So Kweon
- Frank de Zeeuw
- David Eppstein
Venues
- CoRR
- ICIP
- CCCG
- ICCV
- Pattern Recognit.
- Discret. Math.
- BMVC
- J. Math. Imaging Vis.
- ICRA
- Int. J. Comput. Vis.
- CVPR
- Pattern Recognit. Lett.
- IEEE Access
- ICPR
- Discret. Comput. Geom.
- J. Comb. Theory, Ser. A
- Image Vis. Comput.
- Remote. Sens.
- Sensors
- Comput. Geom.
- DAGM-Symposium
- Asia Pac. J. Oper. Res.
- IEEE Trans. Image Process.
- SIBGRAPI
- J. Comb. Optim.
- Vis. Comput.
- EITCE
- GCCE
- CAD/Graphics
- Adv. Artif. Intell. Mach. Learn.
- J. Comput. Appl. Math.
- ECCV (3)
- SoCG
- J. Electronic Imaging
- FSTTCS
- Multim. Tools Appl.
- LATIN
- Int. Trans. Oper. Res.
- J. Sensors
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