LEARNING FROM POSITIVE DATA
Experts
- Rusins Freivalds
- Efim B. Kinber
- Rolf Wiehagen
- Sanjay Jain
- Timo Kötzing
- John Case
- Carl H. Smith
- Thomas Zeugmann
- Andris Ambainis
- Klaus P. Jantke
- Robert P. Daley
- Chris J. Myers
- Bryan Bartley
- Ernst Oberortner
- Takeshi Shinohara
- Markus Dickinson
- Frank Stephan
- Jacob Beal
- Anil Wipat
- Goksel Misirli
- Curtis Madsen
- Gunter Grieser
- John H. Gennari
- Vanja Doskoc
- Kalvis Apsitis
- Setsuo Arikawa
- Michael Bissell
- Nicholas Roehner
- Matthew R. Pocock
- Takayoshi Shoudai
- Herbert M. Sauro
- Raik Grünberg
- Tramy Nguyen
- Kevin Clancy
- James Alastair McLaughlin
- Manuel Blum
- Zhen Zhang
- Steffen Lange
- Chris Macklin
Venues
- CoRR
- ALT
- Theor. Comput. Sci.
- AII
- Inf. Control.
- Inf. Comput.
- J. Inf. Process. Cybern.
- COLT
- J. Integr. Bioinform.
- ICGI
- J. Comput. Syst. Sci.
- J. Symb. Log.
- Nonmonotonic and Inductive Logic
- FCT
- IJCAI
- ECAI
- New Gener. Comput.
- ICALP
- Bull. EATCS
- CiE
- GOSLER Final Report
- MFCS
- LREC
- STACS
- Ann. Pure Appl. Log.
- AII/ALT
- CogSci
- AAAI
- Inf. Sci.
- IEEE Trans. Image Process.
- CIAA
- Sensors
- J. Econ. Theory
- UAI
- TAMC
- J. ACM
- IFIP Congress
- Synth.
- Math. Log. Q.
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