IMPROVE THE RECOGNITION ACCURACY
Experts
- Adnan Amin
- Tetsushi Wakabayashi
- Saad Bin Ahmed
- Muhammad Imran Razzak
- Saeeda Naz
- Pedro Luis Galdámez
- Hiroomi Hikawa
- Jonathan R. Corney
- Fumitaka Kimura
- Jiangying Zhou
- Doug E. R. Clark
- Enrico Blanzieri
- Xizhou Zhu
- Pedro Morgado
- Simone Benatti
- Miguel Ramón Ramón
- Abbas Rahimi
- Jing Liu
- Weijian Deng
- Luca Benini
- Jifeng Dai
- Lu Yuan
- George Nagy
- Bojan R. Babic
- Chun Chen
- Yuwen Xiong
- Ali Moin
- Alessandro L. Koerich
- Daniel P. Lopresti
- Jian-Cheng Huang
- Kimiyasu Kiyota
- Kunjin He
- Nuno Vasconcelos
- Eulanda Miranda dos Santos
- Alisha Menon
- Lianwen Jin
- Lee D. Erman
- Jonathan Ting
- Pei Wang
Venues
- CoRR
- ICDAR
- Pattern Recognit.
- Comput. Aided Des.
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Access
- INTERSPEECH
- ICPR
- IJCNN
- ICASSP
- Neural Comput. Appl.
- Int. J. Comput. Integr. Manuf.
- Systems and Computers in Japan
- Symposium on Solid Modeling and Applications
- CVPR
- DAS
- J. Intell. Manuf.
- Pattern Recognit. Lett.
- MVA
- Multim. Tools Appl.
- Int. J. Autom. Technol.
- Comput. J.
- ICITCS
- Res. Comput. Sci.
- Document Analysis Systems
- Biomed. Signal Process. Control.
- ISCAS
- IJCAI
- ICCSCE
- Vis. Comput.
- J. Appl. Log.
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Intell. Fuzzy Syst.
- SMC
- VISION
- IEICE Trans. Inf. Syst.
- J. Chem. Inf. Model.
- Expert Syst. Appl.
- ICFHR
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