HIT OR MISS
Experts
- Dan Schonfeld
- T. Yung Kong
- Henk J. A. M. Heijmans
- Mohammed Charif-Chefchaouni
- José Crespo
- Jesús Angulo
- John Goutsias
- Chyi-Jou Gau
- Robert M. Haralick
- John C. Handley
- Javier Vidal
- Lidija Comic
- Paola Magillo
- Vassilios Chatzis
- Shuta Murakami
- Fabio Dias
- Isabelle Bloch
- Ioannis Pitas
- Jean Cousty
- Victor Maojo
- Edward R. Dougherty
- Laurent Najman
- Takuo Kikuchi
- Naoki Tanaka
- Nicolas Passat
- Karen Rafferty
- Akira Asano
- Christian Ronse
- Yosuke Nabetani
- Alexandru Caliman
- Khawla Mallat
- Mohamed Krid
- Dongming Zhao
- Santiago Velasco-Forero
- Alain Bretto
- Marc Aiguier
- Jorge Marx Gómez
- Frank Yeong-Chyang Shih
- D. M. P. Hagyard
Venues
- IEEE Trans. Image Process.
- ISMM
- CoRR
- J. Vis. Commun. Image Represent.
- DGCI
- ICIP (2)
- IWCIA
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Math. Imaging Vis.
- EUSIPCO
- CAIP
- Pattern Recognit.
- IEEE Trans. Medical Imaging
- Pattern Recognit. Lett.
- Comput. Vis. Image Underst.
- ISPACS
- Signal Process.
- Inf. Sci.
- ISIVC
- CACML
- Nat.
- CAIP (2)
- Algorithmica
- CVPR (1)
- Discret. Math.
- FUZZ-IEEE
- IEEE Trans. Signal Process.
- ICNC-FSKD
- Discret. Appl. Math.
- Manag. Sci.
- Comput. Graph.
- ICIAR (1)
- ICDIP
- ISPR
- International Conference on Computational Science (2)
- ICPR (3)
- Int. J. Approx. Reason.
- J. Electronic Imaging
- ATSIP
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