HIT OR MISS
Experts
- Dan Schonfeld
- T. Yung Kong
- Mohammed Charif-Chefchaouni
- Henk J. A. M. Heijmans
- Robert M. Haralick
- Jesús Angulo
- John Goutsias
- Chyi-Jou Gau
- José Crespo
- Javier Vidal
- John C. Handley
- Lidija Comic
- Victor Maojo
- Jean Cousty
- Fabio Dias
- Isabelle Bloch
- Ioannis Pitas
- Vassilios Chatzis
- Shuta Murakami
- Paola Magillo
- Laurent Najman
- Takuo Kikuchi
- Edward R. Dougherty
- Michael L. Schauf
- Stefan Wunderlich
- Guillaume Tochon
- Mihai Ivanovici
- Sara Belmil
- Jean Serra
- Peter Sussner
- Moe Razaz
- Rocío González-Díaz
- Peter Gritzmann
- Sunao Nozawa
- Marcos Vinicius Naves Bedo
- Guo Wei
- Shuo Yang
- Stuart Ferguson
- Rabaa Youssef
Venues
- IEEE Trans. Image Process.
- CoRR
- ISMM
- J. Vis. Commun. Image Represent.
- DGCI
- ICIP (2)
- IWCIA
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Math. Imaging Vis.
- EUSIPCO
- CAIP
- Pattern Recognit.
- IEEE Trans. Medical Imaging
- Pattern Recognit. Lett.
- Comput. Vis. Image Underst.
- ISPACS
- Signal Process.
- Inf. Sci.
- Nat.
- CACML
- CAIP (2)
- Algorithmica
- CVPR (1)
- Discret. Math.
- FUZZ-IEEE
- ICNC-FSKD
- IEEE Trans. Signal Process.
- Discret. Appl. Math.
- Manag. Sci.
- Comput. Graph.
- ICDIP
- ISPR
- ICIAR (1)
- International Conference on Computational Science (2)
- J. Electronic Imaging
- Int. J. Approx. Reason.
- ICPR (3)
- HMD Prax. Wirtsch.
- ATSIP
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