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Experts
- Oleksiy B. Pogrebnyak
- Giovanni Ramponi
- Aimin Hao
- Peter Eisert
- Shuai Li
- Ramon Izquierdo-Cordova
- Mamoru Ugajin
- Kai-Kuang Ma
- Justin Varghese
- Decai Chen
- Ingo Feldmann
- John P. Oakley
- Yiru Lian
- Richard T. Shann
- Qing Xia
- Liming Hou
- Oliver Schreer
- Hong Qin
- Volodymyr I. Ponomaryov
- Peng Zhang
- Subash Saudia
- Walterio W. Mayol-Cuevas
- Feng Lian
- Chengju Chen
- Zhenyu Shan
- Boxin Shi
- Asim Smailagic
- Hiroshi Tanimoto
- Rajib Goswami
- Jorge Moragues
- Tingting Li
- Johan Helsing
- Ronan Legin
- Masakatsu G. Fujie
- R. Neelkanthan
- Jianing Song
- Michael F. Barnsley
- Ruihai Dong
- Tian Jin
Venues
- CoRR
- ICIP
- IGARSS
- ICASSP
- Pattern Recognit.
- Remote. Sens.
- EUSIPCO
- Signal Process.
- SIAM J. Imaging Sci.
- IEICE Trans. Inf. Syst.
- Sensors
- ISCAS
- IEEE Trans. Signal Process.
- BioCAS
- Comput. Graph.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE Trans. Consumer Electron.
- OFC
- Pattern Recognit. Lett.
- ICCV
- FPL
- INTERSPEECH
- ICECS
- Multim. Tools Appl.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- ISCAS (4)
- APSIPA
- IET Image Process.
- Vis. Comput.
- IEICE Electron. Express
- IEEE Access
- ICIA
- CDC
- ASICON
- IEEE Trans. Geosci. Remote. Sens.
- J. Digit. Imaging
- FUSION
- ISPA
- IEEE Trans. Circuits Syst. II Express Briefs
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