FIELD OF SURFACE NORMALS
Experts
- Edwin R. Hancock
- Philip L. Worthington
- Hossein Ragheb
- Fabio Sartori
- Dawei Yang
- Jia Deng
- Jianguang Wen
- Abdelrehim H. Ahmed
- Jan Eric Lenssen
- Jonathan Masci
- Qiang Liu
- Fan-Hui Kong
- Shengbiao Wu
- Michael Breuß
- Ryo Kawahara
- Ko Nishino
- Aly A. Farag
- Christian Osendorfer
- Satoshi Murai
- Shohei Nobuhara
- Xiaomin Sun
- Qingsong Sun
- Mark Earnshaw
- Nanning Zheng
- John J. Hench
- Nazar Khan
- Jezekiel Ben-Arie
- A. Yim
- Raquel Urtasun
- Dalei Hao
- Dongran Ren
- Ivan Eichhardt
- Steven J. Gortler
- Ross T. Whitaker
- Marios M. Patrikoussakis
- Lam Tran
- Meng-Yu Kuo
- Christopher G. Atkeson
- Qing Xiao
Venues
- CVPR
- Remote. Sens.
- CoRR
- IGARSS
- ICIP (3)
- Pattern Recognit. Lett.
- ICIP
- Vis. Comput.
- ICPR
- SSPR/SPR
- Pattern Recognit.
- ACC
- MVA
- Int. J. Comput. Vis.
- Comput. Geosci.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICNC (5)
- ICCV
- IEEE Trans. Image Process.
- ICIP (2)
- OFC
- AAAI
- DSP
- ISER
- Image Vis. Comput.
- DAGM-Symposium
- TFCV
- ICIAP
- SMC
- Int. J. Appl. Earth Obs. Geoinformation
- HIS (1)
- Int. J. Bifurc. Chaos
- 3DPVT
- IMR
- Comput. Aided Geom. Des.
- Comput. Vis. Graph. Image Process.
- SCIA
- SSVM
- 3DV
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