FIELD OF SURFACE NORMALS
Experts
- Edwin R. Hancock
- Hossein Ragheb
- Philip L. Worthington
- Fabio Sartori
- Shengbiao Wu
- Fan-Hui Kong
- Qiang Liu
- Jonathan Masci
- Jan Eric Lenssen
- Abdelrehim H. Ahmed
- Jianguang Wen
- Jia Deng
- Dawei Yang
- Shohei Nobuhara
- Satoshi Murai
- Aly A. Farag
- Christian Osendorfer
- Ko Nishino
- Ryo Kawahara
- Michael Breuß
- Chenyu Wu
- Christopher Zach
- Nagesh Basavanhally
- M. Saadatseresht
- Kent Todd
- Ramesh C. Jain
- G. D. J. Smith
- Zhuosen Wang
- Marshall F. Tappen
- Seok-Hyun Ryu
- Oliver Vogel
- Koichiro Deguchi
- Osamu Ikeda
- Bryce Matthews
- Meng Li
- Giuseppe Claudio Guarnera
- David T. Neilson
- Xiaojuan Qi
- Dongqing Chen
Venues
- CVPR
- Remote. Sens.
- CoRR
- IGARSS
- ICIP (3)
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- ICIP
- ACC
- SSPR/SPR
- Vis. Comput.
- ICPR
- Pattern Recognit.
- MVA
- Int. J. Comput. Vis.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Geosci.
- ICNC (5)
- ICCV
- ICIP (2)
- DSP
- ISER
- ICIAP
- Image Vis. Comput.
- TFCV
- SMC
- Int. J. Appl. Earth Obs. Geoinformation
- DAGM-Symposium
- HIS (1)
- IMR
- 3DPVT
- Comput. Aided Geom. Des.
- Int. J. Bifurc. Chaos
- SSVM
- 3DV
- EMMCVPR
- IJCAI
- Comput. Vis. Graph. Image Process.
- SCIA
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