FIELD OF SURFACE NORMALS
Experts
- Edwin R. Hancock
- Hossein Ragheb
- Philip L. Worthington
- Fabio Sartori
- Jan Eric Lenssen
- Michael Breuß
- Jia Deng
- Shohei Nobuhara
- Abdelrehim H. Ahmed
- Ryo Kawahara
- Fan-Hui Kong
- Christian Osendorfer
- Jonathan Masci
- Qiang Liu
- Ko Nishino
- Dawei Yang
- Satoshi Murai
- Aly A. Farag
- Shengbiao Wu
- Jianguang Wen
- Mohsen A. Jafari
- A. Yim
- Enrique Dunn
- Leiku Yang
- Ernesto Lautaro Juarez-Valdes
- Peter M. Hall
- Xingsheng Deng
- Angela Erb
- Peter Kovesi
- Yahui Che
- Sheng-He Sun
- Meng Yang
- Lichi Zhang
- Y. Geng
- Leonidas J. Guibas
- Hung-Tat Tsui
- Jan-Michael Frahm
- Philip Willis
- Giuseppe Claudio Guarnera
Venues
- CVPR
- IGARSS
- ICIP (3)
- Remote. Sens.
- Int. J. Comput. Vis.
- MVA
- Pattern Recognit. Lett.
- ICNC (5)
- ICCV
- Comput. Geosci.
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- CoRR
- ICIP (2)
- IEEE Trans. Image Process.
- Vis. Comput.
- SSPR/SPR
- ICPR
- Pattern Recognit.
- ACC
- IMR
- ACCV (4)
- Int. J. Bifurc. Chaos
- MICCAI
- IJCAI
- VISAPP (2)
- SMC
- HIS (1)
- 3DIMPVT
- ECCV Workshops (2)
- AAAI
- 3DV
- OFC
- ISER
- ICCV Workshops
- SCIA
- IICAI
- VISIGRAPP (3: VISAPP)
- GMP
Related Topics
Related Keywords
Popularity