FACIAL FEATURE TRACKING
Experts
- Feng Lu
- Andreas Bulling
- Yusuke Sugano
- Xucong Zhang
- Qiang Ji
- Yunfei Liu
- Arantxa Villanueva
- Honghai Liu
- Yoichi Sato
- Mario Fritz
- Rafael Cabeza
- John M. Hannah
- Peter M. Grant
- Yihua Cheng
- Zhaokang Chen
- Dimitris N. Metaxas
- Bertram E. Shi
- Haofei Wang
- Eng-Jon Ong
- Richard Bowden
- Zicheng Liu
- Alberto Del Bimbo
- Kenneth Alberto Funes Mora
- Yiwei Bao
- Seonwook Park
- Otmar Hilliges
- Roberto Valenti
- Jean-Marc Odobez
- Hui Yu
- Peter Robinson
- Cristina Palmero
- Takahiro Okabe
- Li Sun
- Sonia Porta
- Atul Kanaujia
- Yunhee Shin
- Gang Liu
- Sergio Escalera
- Pietro Bonazzi
Venues
- CoRR
- FG
- ETRA
- CVPR
- CVPR Workshops
- Multim. Tools Appl.
- BMVC
- ICCV
- ICRA
- ICPR
- ACM Multimedia
- Pattern Recognit. Lett.
- ICIP
- NeuroImage
- WACV
- IEEE Trans. Image Process.
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICASSP
- ROBIO
- SMC
- Neurocomputing
- EMBC
- MMSP
- Neural Process. Lett.
- Sensors
- ICME
- ICCV Workshops
- Proc. ACM Interact. Mob. Wearable Ubiquitous Technol.
- Vis. Comput.
- MVA
- Comput. Graph. Forum
- Humanoids
- ICIP (1)
- Inf. Sci.
- CHI
- AAAI
- IEEE Signal Process. Lett.
- SIBGRAPI
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