FACET MODEL
Experts
- Robert M. Haralick
- Lizheng Lu
- Klaus Jansen
- Lars Rohwedder
- Ilwoo Lyu
- Ioannis Matalas
- Chen Chen
- Haoyi Xiu
- Moo K. Chung
- Alvise Sommariva
- Shih-Gu Huang
- Ulrich Pferschy
- Masashi Matsuoka
- Renlong Pan
- Dorit S. Hochbaum
- Yuichi Tanaka
- Masaki Onuki
- Haiyong Wang
- Layne T. Watson
- Ralph Benjamin
- Laura Florea
- Marco Vianello
- Sijie Zhu
- Kyoung-Sook Kim
- Xin Liu
- Robert J. Cripps
- Santiago Velasco-Forero
- Anqi Qiu
- Tuan D. Pham
- Constantin Vertan
- Valentin Penaud-Polge
- Dany Leviatan
- Chrysostomos L. Nikias
- Vladimir Katkovnik
- Corneliu Florea
- Taojiannan Yang
- David I. Shuman
- Jesús Angulo
- David B. Shmoys
Venues
- CoRR
- J. Approx. Theory
- J. Comput. Appl. Math.
- ICASSP
- Appl. Math. Comput.
- IEEE Trans. Signal Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- SIAM J. Sci. Comput.
- Symmetry
- Appl. Math. Lett.
- IGARSS
- Pattern Recognit.
- IEEE Access
- FSTTCS
- Circuits Syst. Signal Process.
- Humanoids
- IEEE Trans. Inf. Theory
- SIAM J. Comput.
- Numerische Mathematik
- SMC
- J. Comput. Phys.
- GCPR
- IEEE Trans. Commun.
- IEEE Trans. Instrum. Meas.
- Mach. Vis. Appl.
- Comput. Aided Des.
- ICIAP (1)
- Multim. Tools Appl.
- MICCAI (4)
- GECCO (1)
- SN Comput. Sci.
- Comput. Electron. Agric.
- MASS
- WSDM
- ICNC-FSKD
- Int. J. Comput. Vis.
- ICCA
- EDGE
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